Esco Optics, Inc.

Witness Sample, Transmission, IR

Witness Sample, Transmission, IR - Main image
$24.48 $36 In stock

Category: Transmission Witness Samples

Esco Optics witness samples used for transmission are precision polished on both sides to a scratch dig of 60-40. Flatness of each side is < 1 wave @ 633nm at 80% CA. Parallelism < 1 arc min. Witness sample diameter is 25.40mm and the thickness is 1.50mm. All materials are fabricated from single crystals. Edges are safety beveled. 

The refractive index values listed are representative of nd at 587nm. 

Diameter 25.40 mm +\-0.10
Thickness  1.50 mm +/-0.25
Flatness < 1.0 wave @ 633nm 
Surface Quality 60-40 scratch-dig
Edges Fine ground and beveled
Materials CaF2, Sapphire, ZnSe, Germanium, Silicon
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Customer Reviews (5.0 / 5 · 5 reviews)

Ellie A. ★★★★★

The 60-40 scratch-dig polish is impressively clean, and the parallelism is spot on for my collimation test. These samples gave me consistent, repeatable results right out of the box.

Elizabeth ★★★★★

Flatness held under a wave at 633nm like the spec sheet promised. Both faces are properly polished at 60-40, and parallelism checked out fine on my bench. No edge chips either, which has been an issue with other suppliers.

Eli E. ★★★★★

Ordered the IR transmission sample to check our coating runs before committing a full batch, and the parallelism held up nicely when I put it under the interferometer. Flatness looked well within a wave at 633nm too, so I trust these readings.

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